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HVA
60 4 in 1 Universal High
Voltage Test
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Find
Weak Cables Without Making Cables Weak
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Operational
Features
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The
smallest, lightest, most advanced universal high
voltage test instrument available, ideally suited
for a variety of applications.
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VLF
(0.1Hz), DC (±), Cable Fault Conditioning (Burning),
and Sheath/Jacket Testing modes all included.
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Fully
Automatic or manual cable test sequences complying
with International Standards/Guides such
as IEEE 400.2, VDE 0296, CENELEC, etc.
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Design
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The
HVA60 is not only the most advanced HV test system
available, it is also the lightest, most compact instrument of its type on the
market. The HVA60 has the highest power to weight ratio of any comparable unit
available.
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There
is no need to carry two pieces of equipment around and then interconnect them!
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Apart
from the variable frequency VLF output, the operator can also select dual
polarity DC and cable jacket or sheath testing outputs modes.
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The
applied test voltage, current, capacitance, resistance and time are displayed
and recorded.
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The
instrument is easily programmable allowing the operator to setup or select test
sequences in either automatic or manual mode.
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The
HVA60 is capable of testing 1µF (Approx. 10,000 ft/ 3000m of cable) at 0.1Hz
and 60kV peak. The frequency of the output can also be reduced allowing even
larger capacitance loads to be tested. At 0.02Hz, approx. 50,000 ft/15,000m of
cable can be tested.
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To
assist the operator, the instrument will automatically calculate the optimum
frequency to be selected for larger loads.
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The
load independent, symmetrical output waveform avoids the potentially destructive
space charge effects caused by DC polarization that occurs in aged extruded
cables such as XLPE / PE / EPR, causing them to fail prematurely when exposed to
conventional high voltage DC or to test instruments with large non-symmetrical
output waveforms.
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Should
a breakdown occur during testing, the actual voltage at which it occurred is
displayed and recorded. If cable burning (fault conditioning) mode is activated,
the fault resistance can be conditioned to allow easier and less stressful fault
location techniques to
be applied.
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Test
results are stored in the instrument’s onboard memory allowing easy retrieval
and download to a
PC/Laptop
for review and analysis.
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